Značky
| 1. Autor | Název titulu | Vydavatelství | Rok | Cena | |
|---|---|---|---|---|---|
| Sachdev M. | Defect Oriented Testing for CMOS Analog and Digital Circuits | Kluwer AP | 1998 | Na vyžádání | |
| Artman M. | Cardiovascular Development and Congenital Malformations | Blackwell | 2005 | Na vyžádání | |
| Li Z. | Organic Light-Emitting Materials and Devices | CRC Press | 2006 | 5 201 Kč | |
| Atomic Transport and Defect Phenomena in Solids: Faraday Discussions No 134 | Royal Society for Chemistry | 2007 | 6 121 Kč | ||
| David C. Jiles | Introduction to the Principles of Materials Evaluation | Taylor & Francis | 2007 | 2 372 Kč | |
| Snyder, R.L. | Defect and Microstructure Analysis by Diffraction | Oxford UP | 2000 | Na vyžádání | |
| Freund L. | Thin Film Materials: Stress, Defect Formation and Surface Evolution | Cambridge University Press | 2008 | 1 691 Kč |