Značky
| 1. Autor | Název titulu | Vydavatelství | Rok | Cena | |
|---|---|---|---|---|---|
| Bowen D. | X-Ray Metrology in Semiconductor Manufacturing | Taylor & Francis | 2006 | Na vyžádání | |
| D.K. Singh | Fundamentals of Manufacturing Engineering | Taylor & Francis | 2008 | 2 333 Kč | |
| French College of Metrology | Transverse Disciplines in Metrology: Proceedings of the 13th International Metrology Congress | Wiley | 2009 | 8 104 Kč | |
| Horn A. | Ultra-fast Material Metrology | Wiley | 2009 | Na vyžádání | |
| John K. Taylor,Cheryl Cihon | Statistical Techniques for Data Analysis | Taylor & Francis | 2004 | 2 065 Kč | |
| Glaser M. | Handbook of Metrology | Wiley | 2010 | Na vyžádání | |
| D. Brynn Hibbert | Data Analysis for Chemistry, An Introductory Guide for Students and Laboratory Scientists | Oxford University Press | 2005 | Na vyžádání | |
| Muammer Koc,Tugrul Ozel | Micro–Manufacturing: Design and Manufacturing of Micro–Products | Wiley | 2011 | 2 867 Kč | |
| Richard S. Figliola,Donald E. Beasley | Theory and Design for Mechanical Measurements | Wiley | 2011 | 6 086 Kč | |
| Stefan Landis | Nano Lithography | Wiley | 2011 | 2 899 Kč | |
| Whitehouse J. D. | Handbook of Surface and Nanometrology | CRC Press | 2010 | 9 277 Kč | |
| Valery A. Slaev,Anna G. Chunovkina,Leonid A. Mironovsky | Metrology and Theory of Measurement | De Gruyter | 2013 | 4 287 Kč | |
| Naftaly M. | Terahertz Metrology | Artech House | 2014 | 4 494 Kč | |
| Paul Seidel | Applied Superconductivity: Handbook on Devices and Applications | Wiley | 2015 | 13 759 Kč |