Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

This book presents the theoretical principles and practical applications for classical and advanced interferometry in optical–metrology. A major novelty of this work is the use of the Frequency Transfer Function (FTF) and the theory of Stochastic Process in fringe pattern analysis. These mathematical tools better describe the phase demodulation algorithms with desired spectral response, detuning insensitivity, signal–to–noise robustness and harmonic rejection. From the contents:  Digital Linear Systems  Synchronous Temporal Interferometry  Asynchronous Temporal Interferometry  Spatial Methods with Carrier  Spatial Methods without Carrier  Phase Unwrapping  List of 40 Phase–Shifting Algorithms