Nanobeam X–Ray Scattering: Probing Matter at the Nanoscale

A comprehensive overview of X–ray scattering using nano–focused beams for probing matter at the nanoscale is presented. The monograph includes guidance on the design of nano–beam experiments and discusses various sources, including free electron lasers, synchrotron radiation and special laboratory sources. The rapid progress of this research area was initiated by the availability of brilliant well–collimated synchrotron X–ray sources and is strongly linked to the recent development of state–of–the art devices now capable to focus hard X–rays. Accordingly, several experimental methods have developed, such as nano–beam based scanning diffraction microscopy and spectroscopy, coherent diffraction imaging, etc. They are used in a broad range of applications in material science, from semiconductor nanostructures to biological specimen. It therefore seems a good time to give a first résumé on the achievements made, an overview on techniques and applications currently available, and based on that, an outlook on the potential of this approach. From the contents: X–ray diffraction principles X–ray focusing elements characterization Nanobeam diffraction Nanobeam diffraction setups Spectroscopic techniques using focused beams Coherent diffraction Coherent limits Future developments