Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Tanaka Nobuo
ISBN: 9781848167896
Vydavatelství: World Scientific
Rok vydání: 2014
Vazba: Hardback
Počet stran: 616
Dostupnost: Skladem
Původní cena: 4 768 Kč
Výstavní cena:
4 291 Kč(t.j. po slevě 10%)
(Cena je uvedena včetně 10% DPH)
Katalogová cena: 129 GBP
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Termín dodání na naši pobočku v Brně je přibližně 3-4 týdny.
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.