G.A. Eiceman, Z. Karpas, Herbert H. Hill, Jr. - Ion Mobility Spectrometry
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Ion Mobility Spectrometry

G.A. Eiceman, Z. Karpas, Herbert H. Hill, Jr.

ISBN: 9781138199484
Vydavatelství: Taylor & Francis
Rok vydání: 2016
Vydání: 3
Vazba: Paperback
Počet stran: 444
Dostupnost: Na objednávku

Původní cena: 1 938 Kč
Výstavní cena: 1 744 Kč(t.j. po slevě 10%)
(Cena je uvedena včetně 10% DPH)
Katalogová cena: 56.99 GBP

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Since the turn of the twenty-first century, applications of ion mobility spectrometry (IMS) have diversified, expanding their utility in the military and security spheres and entering the realms of clinical practice and pharmaceutical exploration. Updated and expanded, the third edition of Ion Mobility Spectrometry begins with a comprehensive discussion of the fundamental theory and practice of IMS. Divided into four sections—Overview, Technology, Fundamentals, and Applications—the authors treat innovations and advances in all aspects of IMS in a fresh, thorough, and revised format. Features: Introduces the definitions, theory, and practice of IMS and summarizes its history from the beginnings of the study of ions to present commercial and scholarly activities Presents the technology of IMS from a measurement perspective—covering inlet through ion formation, ion injection, electric fields, drift tube structures, and detectors Covers the end results of measurement, the mobility spectrum, and the transformative trend of ion mobility: mass spectrometry Discusses the influence on the experimental parameters on the mobility of ions Mobility-based methods are no longer restricted to volatile substances and indeed the many benefits of this technology—simplicity, convenience, and the low cost of technology—have become recognized as meritorious in a wide range of uses. This is also true for the advantages of measurements—high speed, distinctive spectral features, and operation in ambient pressure with thermalized ions. Ion Mobility Spectrometry, Third Edition serves specialists in the field of IMS who are interested in the potential of recent developments and researchers, engineers, and students who want a comprehensive overview of this technology.

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