Značky
| 1. Autor | Název titulu | Vydavatelství | Rok | Cena | |
|---|---|---|---|---|---|
| Bentley R. | Temperature and Humidity Measurement | Springer | 1998 | Na vyžádání | |
| Dalia G. Yablon | Scanning Probe Microscopy for Industrial Applications | Wiley | 2013 | 2 813 Kč | |
| Abdelkhalak El Hami | Embedded Mechatronic Systems, Volume 1 | ISTEPELS | 2015 | 2 865 Kč | |
| Abdelkhalak El Hami | Embedded Mechatronic Systems, Volume 2 | ISTEPELS | 2015 | 2 865 Kč | |
| Yuriy Posudin | Methods of Measuring Environmental Parameters | Wiley | 2014 | 2 583 Kč |